Webinar Date: Thursday, November 3, 2016
Time: 9:30 AM – 3:30 PM (PST)
Speakers: from IBM, Cisco, Xia, iROC, Xilinx, Cypress
Location: on the Web
Event Details & Registration: www.cpmt.org/scv/?p=197
Summary: The annual IEEE Soft Error Rate Workshop, now in its 8th year, continues its unique offering of simultaneous in-room and remote participation (via WebEx), with discussions on a variety of critical issues on SER (Soft Error Rates) for an ever-increasing international audience. Attendees can participate in any of the three Tutorials: — An Introduction to Single Event Effects (Xilinx) — System Design Considerations for Soft Error Mitigation (iROC) — Techniques and Challenges of Alpha Emissivity Measurements (XIA, IBM). In addition, there are four technical presentations on current issues and case studies: — Challenges of Alpha Testing (Cisco) — Resilience and Inexact Computing (Los Alamos Labs) — Soft Error Upset Sensitivity to the Array Background Pattern in SLC Flash Memories (Cypress) — Alpha-Induced Soft Errors in Xilinx UltraScale+ Devices (Xilinx)
See the website for summaries of the tutorials and talks, the speaker listing, and to register.
— CPMT — three Tutorials, four talks, packaging materials, alpha particles, testing …