Webinar Date: Thursday, December 20, 2018
Time: 10:00 AM (PT)
Speaker: Alan M Ross, Vice President of Reliability, SD Myers
Location: on the Web
Event Details & Registration: smartgrid.ieee.org
Summary: The application of Reliability Engineering disciplines and principles provides a unique perspective to a Smart Grid. In this webinar we will look at how technology, UIoT, Machine Learning and Condition Based Monitoring can positively affect the long-term reliability of the Grid.
While reliability engineering starts at the design phase for asset management decisions, an even greater impact will be on the system those assets comprise. For the most part we are redesigning systems, not designing from scratch, adding technological advances while integrating wide-scale DER and DR into the grid.
Bio: Alan Ross is the Vice President of Reliability for SD Myers. He is a credentialed reliability professional with both the CMRP and CRL certifications and is a member of the IEEE Reliability Society. Alan Is the Chair of the Smart Grid working group for SMRP and the Electrical Power Reliability Summit and on the Planning Committee and Keynote speaker for the Comet Conference. He is a dynamic and frequent presenter or keynote speaker at NETA, Comet, EPRS, SMRP Conference and Symposium, Marcon, Reliability Conference, AIST, IMC and numerous Muni/CoOp regional organizations. Alan has published frequently in AIST Journal, Plant Engineering, Solutions Magazine, Uptime Magazine and on the blog Transformer Reliability, and numerous white papers on the adoption of new technology, reliability and leadership.
— design, redesign, tech advances, integration, rel principles, machine learning, monitoring …