Location: on the Web
RSVP: Registration Link will be provided on this webpage prior to the event: https://mtt.org/mtt-s-webinars-2020/
Event Details & Registration: IEEE
Current microwave and high frequency instrumentation perform many tasks behind the scenes, even more so in the mm-wave and high modulation rate regimes, and it is easy to lose track of how the equipment, the processing algorithms, the setup and the signals are interacting. By exploring the measurement mechanics within some common instruments under practical conditions, it may be easier to understand where sensitivities or anomalies might increase and how to mitigate them. Through a study of example architectures and measurements, including those in the 100+ GHz range and those with wide modulation bandwidths where linearity, dynamic range and other physical metrics are stressed even more, mechanisms and ideas for better measurements will be explored.