Design for Reliability and Accelerated Testing in Electronics and Photonics Packaging Engineering 🗓

— improved reliability, critical applications, product lifetime, DfR, HALT …

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Organizer: Free IEEE-EPS Webinar
Webinar Date: Tuesday, August 25, 2020
Time: 8 AM
Speaker: Dr. Ephraim Suhir, Portland State University; Life Fellow of the IEEE; EPS Distinguished Lecturer
Location: on the Web
Cost: none
Event Details & Registration: IEEE

This webinar addresses an evolving philosophy of accelerated testing in electronic and photonic packaging, and could be viewed as a possible extension and modification of Highly Accelerated Life Testing (HALT) for applications where a high level of operational reliability is critical, such as aerospace, military, long-haul communications, self-driving vehicles, or medical. The highly focused and highly cost-effective Failure Oriented Accelerated Testing (FOAT) approach is suggested as a suitable experimental basis for the Probabilistic Design for Reliability (PDfR) concept. The PDfR concept is used to assess a product’s lifetime and the corresponding never-zero probability of failure in the field for the given product and application and make this probability adequate for the given product and application. The general concepts are illustrated by numerical examples.